.css-1xsl8rf{width:100%;display:-webkit-box;display:-webkit-flex;display:-ms-flexbox;display:flex;-webkit-align-items:center;-webkit-box-align:center;-ms-flex-align:center;align-items:center;position:relative;overflow:hidden;background:var(--alert-bg);-webkit-padding-start:var(--chakra-space-4);padding-inline-start:var(--chakra-space-4);-webkit-padding-end:var(--chakra-space-4);padding-inline-end:var(--chakra-space-4);padding-top:var(--chakra-space-1);padding-bottom:var(--chakra-space-1);--alert-fg:var(--chakra-colors-orange-600);--alert-bg:var(--chakra-colors-orange-100);font-weight:var(--chakra-fontWeights-semibold);padding-left:var(--chakra-space-4);}.chakra-ui-dark .css-1xsl8rf:not([data-theme]),[data-theme=dark] .css-1xsl8rf:not([data-theme]),.css-1xsl8rf[data-theme=dark]{--alert-fg:var(--chakra-colors-orange-200);--alert-bg:rgba(251, 211, 141, 0.16);}@media screen and (min-width: 48em){.css-1xsl8rf{padding-left:var(--chakra-space-8);}}Bitte aktivieren Sie Javascript um alle Funktionen nutzen zu können und ihre Nutzererfahrung zu verbessern.

Abstract Talk
AT 029

Increase of reverse leakage current at GaN p-n junctions having different blocking voltages after forward current stress

Termin

Datum: 10.10.2022

Zeit: 16:15 – 16:30

Redezeit: 12 Min.

Diskussionszeit: 3 Min.

Ort / Stream:

Salon Rome

Session

Vertical devices I

Themen

Characterization
Electronic devices

Mitwirkende

Dr. Tetsuo Narita (Toyota Central R&D Labs., Inc. / JP), Dr. Yoshitaka Nagasato (MIRISE Technologies / JP), Dr. Masakazu Kanechika (Nagoya University / JP), Takeshi Kondo (Nagoya University / JP), Prof. Dr. Tsutomu Uesugi (Nagoya University / JP), Prof. Dr. Kazuyoshi Tomita (Nagoya University / JP), Satoshi Ikeda (MIRISE Technologies / JP), Dr. Hiroki Watanabe (MIRISE Technologies / JP), Tomoyuki Shoji (Toyota Central R&D Labs., Inc. / JP), Tomohiko Mori (Toyota Central R&D Labs., Inc. / JP), Satoshi Yamaguchi (Toyota Central R&D Labs., Inc. / JP), Yasuji Kimoto (Toyota Central R&D Labs., Inc. / JP), Masayoshi Kosaki (Toyoda Gosei / JP), Tohru Oka (Toyoda Gosei / JP), Dr. Jun Kojima (Nagoya University / JP), Professor Jun Suda (Nagoya University / JP)