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IWN 2022
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Dr. Tetsuo Narita
Toyota Central R&D Labs., Inc. / JP
Toyota Central R&D Labs., Inc.
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Datum
Invited Speaker
11.10.2022
10:30
–
11:00
25 Min.
5 Min.
Invited Talk
IT 21
Diffusion of Mg and H atoms in Mg-doped and Mg ion-implanted GaN through annealing
Vortrag
10.10.2022
16:15
–
16:30
12 Min.
3 Min.
Abstract Talk
AT 029
Increase of reverse leakage current at GaN p-n junctions having different blocking voltages after forward current stress
Characterization, Electronic devices
12.10.2022
18:00
–
20:00
0 Min.
120 Min.
Discussion
Panel discussion
Weitere Beteiligungen
10.10.2022
16:15
–
16:30
12 Min.
3 Min.
Abstract Talk
AT 029
Increase of reverse leakage current at GaN p-n junctions having different blocking voltages after forward current stress
Characterization, Electronic devices
14.10.2022
09:15
–
09:30
12 Min.
3 Min.
Abstract Talk
AT 235
Temperature dependence of impact ionization coefficients in GaN
Characterization, Electronic devices
14.10.2022
11:00
–
11:15
12 Min.
3 Min.
Abstract Talk
AT 246
Percentage of C
N
acceptors to residual carbon atoms in n-type GaN homoepitaxial layers
Characterization, Electronic devices
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