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  • Abstract Talk
  • AT 235

Temperature dependence of impact ionization coefficients in GaN

Termin

Datum:
Zeit:
Redezeit:
Diskussionszeit:
Ort / Stream:
Salon Rome

Session

Modelling and characterization

Themen

  • Characterization
  • Electronic devices

Mitwirkende

Professor Takuya Maeda (Kyoto University / JP), Dr. Tetsuo Narita (Toyota Central R&D Labs. Inc. / JP), Dr. Shinji Yamada (Nagoya University / JP; ULVAC Inc. / JP), Professor Tetsu Kachi (Nagoya University / JP), Professor Tsunenobu Kimoto (Kyoto University / JP), Prof. Dr. Masahiro Horita (Kyoto University / JP; Nagoya University / JP), Professor Jun Suda (Nagoya University / JP; Kyoto University / JP)

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