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IWN 2022
Programm
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Prof. Dr. William Alan Doolittle
Georgia Institute of Technology / US
Georgia Institute of Technology
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Datum
Vorsitz
11.10.2022
17:15
–
18:00
Session
MOS Devices
Salon Rome
Invited Speaker
11.10.2022
15:30
–
16:00
25 Min.
5 Min.
Invited Talk
IT 24
Very high n and p-type conduction in (Al)GaN including the first demonstration of AlN pn homojunction Diodes
Vortrag
12.10.2022
18:00
–
20:00
0 Min.
120 Min.
Discussion
Panel discussion
Weitere Beteiligungen
11.10.2022
Poster Presentation
PP 221
Observation compositional modulation variation and reduction in rapidly grown AlGaN self-assembled superlattices by transmission electron microscopy
Characterization, Growth
11.10.2022
Poster Presentation
PP 284
The effect of Be doping concentration on thermal conductivity of p-type AlN thin films
Characterization, Novel Materials and Nanostructures
11.10.2022
Poster Presentation
PP 271
Advancements in aluminum indium nitride growth over a wide compositional range – towards long wavelength III-Nitride optoelectronics
Characterization, Growth
12.10.2022
09:15
–
09:30
12 Min.
3 Min.
Abstract Talk
AT 116
Demonstration of Sc0.2Al0.8N HEMT structures with a sheet resistance of 150 Ω/□ and a sheet charge of 5.9x1013 cm-2 with phase pure, metal rich growth
Electronic devices, Growth
12.10.2022
09:30
–
09:45
12 Min.
3 Min.
Abstract Talk
AT 125
Vertical cation segregation during A
x
B
1-x
N epitaxy
Characterization, Growth
12.10.2022
11:30
–
11:45
12 Min.
3 Min.
Abstract Talk
AT 136
Quasi-vertical p-i-n diodes achieving high breakdown performance with GaN:Be I-layer and current spreading layer
Electronic devices, Growth
12.10.2022
Poster Presentation
PP 365
Improved nucleation of 111 ScN thin films
Characterization, Growth
12.10.2022
Poster Presentation
PP 341
p-type AlN based heteroepitaxial diodes with Schottky, PIN and junction barrier Schottky character achieving significant breakdown performance
Electronic devices, Growth
12.10.2022
17:00
–
17:15
12 Min.
3 Min.
Abstract Talk
AT 180
Realization of AlN homojunction PN diodes
Electronic devices, Growth
14.10.2022
09:30
–
09:45
12 Min.
3 Min.
Abstract Talk
AT 228
Observation of interfacial strain relaxation and electron beam damage thresholds in Al
0.3
In
0.7
N/GaN heterostructures by transmission electron microscope
Characterization, Growth
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