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  • Abstract Talk
  • AT 228

Observation of interfacial strain relaxation and electron beam damage thresholds in Al0.3In0.7N/GaN heterostructures by transmission electron microscope

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Room Berlin

Session

Structural Characterization, Growth model-2

Themen

  • Characterization
  • Growth

Mitwirkende

Keisuke Motoki (Georgia Institute of Technology / US), Zachary Engel (Georgia Institute of Technology / US), Christopher M. Matthews (Georgia Institute of Technology / US), Dr. Habib Ahmad (Georgia Institute of Technology / US), Timothy M. McCrone (Georgia Institute of Technology / US), Kohei Harada (Georgia Institute of Technology / US), Prof. Dr. William Alan Doolittle (Georgia Institute of Technology / US)

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