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Investigation of room-temperature sputtered n-type GaN sub-contact layer in ohmic contact to MOCVD-grown GaN:Si films

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Topic Electronic devices

Session

Electronic devices

Themen

  • Characterization
  • Electronic devices

Mitwirkende

Monika Masłyk (Institute of High Pressure Physics, Polish Academy of Sciences / PL), Dr. Paweł Prystawko (Institute of High Pressure Physics, Polish Academy of Sciences / PL), Ewa Grzanka (Institute of High Pressure Physics, Polish Academy of Sciences / PL), Marcin Kryśko (Institute of High Pressure Physics, Polish Academy of Sciences / PL), Prof. Dr. Eliana Kamińska (Institute of High Pressure Physics, Polish Academy of Sciences / PL)

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