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  • Abstract Talk
  • AT 022

Direct probing of the internal electrical field of a pn-GaN-junction

Appointment

Date:
Time:
Talk time:
Discussion time:
Location / Stream:
Room Berlin

Session

Optical Characterization 2

Topics

  • Characterization
  • Electronic devices

Authors

Konstantin Wein (Otto-von-Guerecke University / DE), Prof. Dr. Frank Bertram (Otto-von-Guerecke University / DE), Dr. Gordon Schmidt (Otto-von-Guerecke University / DE), Peter Veit (Otto-von-Guerecke University / DE), Professor Jürgen Christen (Otto-von-Guerecke University / DE), Arne Debald (RWTH University / DE; AIXTRON SE / DE), Prof. Dr. Michael Heuken (AIXTRON SE / DE; RWTH University / DE), Thorsten Zweipfennig (RWTH University / DE), Dr. Holger Kalisch (RWTH University / DE), Professor Andrei Vescan (RWTH University / DE)

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