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Plenary Session

Matteo Meneghini
Defects and reliability in GaN electronics and optoelectronics: challenges and perspectives

Termin

Datum: 14.10.2022

Zeit: 12:15 – 13:00

Ort / Stream:

Room Berlin

Chair

Programm

12:15 – 13:00 30 Min. 15 Min.
Plenary Talk
P 04
Defects and reliability in GaN electronics and optoelectronics: challenges and perspectives
Professor Matteo Meneghini (University of Padova / IT)

Matteo MeneghiniDefects and reliability in GaN electronics and optoelectronics: challenges and perspectives

Termin

Chair

Programm

Matteo Meneghini
Defects and reliability in GaN electronics and optoelectronics: challenges and perspectives