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Plenary Session

Matteo Meneghini
Defects and reliability in GaN electronics and optoelectronics: challenges and perspectives

Appointment

Date: 14/10/2022

Time: 12:15 – 13:00

Location / Stream:

Room Berlin

Chair

Programme

12:15 – 13:00 30 Min. 15 Min.
Plenary Talk
P 04
Defects and reliability in GaN electronics and optoelectronics: challenges and perspectives
Professor Matteo Meneghini (University of Padova / IT)

Matteo MeneghiniDefects and reliability in GaN electronics and optoelectronics: challenges and perspectives

Appointment

Chair

Programme

Matteo Meneghini
Defects and reliability in GaN electronics and optoelectronics: challenges and perspectives