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  • Abstract Talk
  • AT 174

Correlation between non-ionizing energy loss and production rates of an electron trap at EC– (0.12-0.20) eV formed by various energetic particles in gallium nitride

Termin

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Room Berlin

Session

Deep levels, Defect, NRCs-2

Themen

  • Characterization
  • Electronic devices

Mitwirkende

Keito Aoshima (Nagoya University / JP), Prof. Dr. Masahiro Horita (Nagoya University / JP), Professor Jun Suda (Nagoya University / JP)

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