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DFT based modeling of point defect diffusion across the In0.125Ga0.875N/GaN and In0.25Ga0.75N/GaN interfaces

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Topic Characterization

Session

Characterization

Themen

  • Characterization
  • Growth

Mitwirkende

Roman Hrytsak (Institute of High Pressure Physics "Unipress", PAS / PL; University of Rzeszow / PL), Dr. Pawel Kempisty (Institute of High Pressure Physics "Unipress", PAS / PL), Ewa Grzanka (Institute of High Pressure Physics "Unipress", PAS / PL), Professor Mike Leszczyński (Institute of High Pressure Physics "Unipress", PAS / PL), Professor Malgorzata Sznajder (University of Rzeszow / PL)

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