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  • Poster Presentation
  • PP 023

Modeling of TAT-related forward leakage current in InGaN/GaN SQW LEDs based on experimentally-determined defects parameters

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Topic Characterization

Session

Characterization

Themen

  • Characterization
  • Optical devices

Mitwirkende

Dr. Matteo Buffolo (University of Padova / IT), Nicola Roccato (University of Padova / IT), Dr. Francesco Piva (University of Padova / IT), Dr. Carlo De Santi (University of Padova / IT), Dr. Camille Haller (Ecole Polytechnique fédérale de Lausanne (EPFL) / CH), Dr. Jean-François Carlin (Ecole Polytechnique fédérale de Lausanne (EPFL) / CH), Professor Nicolas Grandjean (Ecole Polytechnique fédérale de Lausanne (EPFL) / CH), Dr. Alberto Tibaldi (Politecnico di Torino / IT), Professor Francesco Bertazzi (Politecnico di Torino / IT), Professor Michele Goano (Politecnico di Torino / IT), Professor Giovanni Verzellesi (University of Modena and Reggio Emilia / IT), Professor Gaudenzio Meneghesso (University of Padova / IT), Professor Enrico Zanoni (University of Padova / IT), Professor Matteo Meneghini (University of Padova / IT)

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