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  • Poster Presentation
  • PP 323

Real-space analysis on surface potential fluctuations of Al2O3/GaN interfaces by scanning nonlinear dielectric microscopy

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Topic Characterization

Session

Characterization

Topics

  • Characterization
  • Electronic devices

Authors

Professor Kohei Yamasue (Tohoku University / JP), Dr. Yuto Ando (Nagoya University / JP), Professor Manato Deki (Nagoya University / JP), Prof. Dr. Hiroshi Amano (Nagoya University / JP), Professor Yasuo Cho (Tohoku University / JP)

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