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Poster Presentation
PP 238

Observation of degradation in 0.18 μm GaN HEMTs by high field stress using source field plate

Appointment

Date: 11/10/2022

Time: 18:00 – 18:00

Talk time: 0 Min.

Discussion time: 0 Min.

Location / Stream:

Topic Electronic devices

Session

Electronic devices

Topics

Electronic devices
Novel Materials and Nanostructures

Authors

Seunghwan Kim (Hongik University / KR), Professor Jongsun Kim (Hongik University / KR), Byungkyu Min (Electronic and Telecommunications Research Institute / KR), Kyujun Cho (Electronic and Telecommunications Research Institute / KR), Jongmin Lee (Electronic and Telecommunications Research Institute / KR), Yujin Jang (Electronic and Telecommunications Research Institute / KR), Dongmin Kang (Electronic and Telecommunications Research Institute / KR), Professor Hyungtak Kim (Hongik University / KR)