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IWN 2022
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Seunghwan Kim
Hongik University / KR
Hongik University
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11/10/2022
Poster Presentation
PP 238
Observation of degradation in 0.18 μm GaN HEMTs by high field stress using source field plate
Electronic devices, Novel Materials and Nanostructures
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11/10/2022
Poster Presentation
PP 238
Observation of degradation in 0.18 μm GaN HEMTs by high field stress using source field plate
Electronic devices, Novel Materials and Nanostructures
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