Back
  • Abstract Talk
  • AT 246

Percentage of CN acceptors to residual carbon atoms in n-type GaN homoepitaxial layers

Appointment

Date:
Time:
Talk time:
Discussion time:
Location / Stream:
Room Berlin

Session

Late News Characterization

Topics

  • Characterization
  • Electronic devices

Authors

Dr. Kazutaka Kanegae (Kyoto University / JP), Dr. Tetsuo Narita (Toyota Central R&D Labs. Inc. / JP), Prof. Dr. Kazuyoshi Tomita (Toyota Central R&D Labs. Inc. / JP), Professor Tetsu Kachi (Institute of Materials and Systems for Sustainability (IMaSS) / JP), Prof. Dr. Masahiro Horita (Nagoya University / JP), Professor Tsunenobu Kimoto (Kyoto University / JP), Professor Jun Suda (Institute of Materials and Systems for Sustainability (IMaSS) / JP; Kyoto University / JP)

  • © Conventus Congressmanagement & Marketing GmbH