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Dr. Hiroki Watanabe

DENSO CORPORATION / JP

DENSO CORPORATION

Further involvements

10/10/2022
16:15 – 16:30 12 Min. 3 Min.
Abstract Talk
AT 029
Increase of reverse leakage current at GaN p-n junctions having different blocking voltages after forward current stress
Characterization, Electronic devices
10/10/2022
Poster Presentation
PP 010
Analysis of dislocations in GaN crystals using defocus convergent-beam electron diffraction (CBED)
Characterization, Growth