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  • Poster Presentation
  • PP 010

Analysis of dislocations in GaN crystals using defocus convergent-beam electron diffraction (CBED)

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Topic Characterization

Session

Characterization

Topics

  • Characterization
  • Growth

Authors

Dr. Jun Kojima (Nagoya University / JP), Dr. Shoichi Onda (Nagoya University / JP), Prof. Dr. Shigeyoshi Usami (Nagoya University / JP), Dr. Hiroki Watanabe (Nagoya University / JP)

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