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Sputtering epitaxial preparation of AlN/Al0.5Ga0.5N HEMTs with heavily Si-doped degenerate GaN contacts

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Topic Electronic devices

Session

Electronic devices

Themen

  • Electronic devices
  • Growth

Mitwirkende

Professor Ryota Maeda (The University of Tokyo / JP), Dr. Kohei Ueno (The University of Tokyo / JP), Professor Atsushi Kobayashi (The University of Tokyo / JP), Professor Hiroshi Fujioka (The University of Tokyo / JP)

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