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  • Poster Presentation
  • PP 214

Observation of novel orientations in an AlN thin film grown on m-plane sapphire using electron backscatter diffraction

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Topic Characterization

Session

Characterization

Topics

  • Characterization
  • Growth

Authors

Dr. Jochen Bruckbauer (University of Strathclyde / GB), Dr. Gergely Ferenczi (University of Strathclyde / GB), Dr. Humberto Foronda (Technische Universität Berlin / DE), Sarina Graupeter (Technische Universität Berlin / DE), Dr. Ben Hourahine (University of Strathclyde / GB), Dr. Aimo Winkelmann (University of Strathclyde / GB; AGH University of Science and Technology / PL), Dr. Zhi Li (University of Sheffield / GB), Ling Jiu (University of Sheffield / GB), Jie Bai (University of Sheffield / GB), Professor Tao Wang (University of Sheffield / GB), Dr. Tim Wernicke (Technische Universität Berlin / DE), Prof. Dr. Michael Kneissl (Technische Universität Berlin / DE), Dr. Carol Trager-Cowan (University of Strathclyde / GB)

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