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Poster Presentation
PP 125

Comparison of the crystal quality of InGaN/GaN multiple quantum wells grown on sapphire and GaN substrate using X-ray diffraction

Appointment

Date: 11/10/2022

Time: 13:15 – 13:15

Talk time: 0 Min.

Discussion time: 0 Min.

Location / Stream:

Topic Characterization

Session

Characterization

Topics

Characterization
Growth

Authors

Dr. Byeongchan So (Karlsruhe Institute of Technology (KIT) / DE), Dr. Sondes Bauer (Karlsruhe Institute of Technology (KIT) / DE), Ewa Grzanka (Polish Academy of Sciences / PL), Professor Vaclav Holý (Charles University / CZ; Masaryk University / CZ), Professor Mike Leszczyński (Polish Academy of Sciences / PL), Professor Tilo Baumbach (Karlsruhe Institute of Technology (KIT) / DE)