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Dr. Sondes Bauer

Karlsruhe Institute of Technology (KIT) / DE

Karlsruhe Institute of Technology (KIT)

Further involvements

10/10/2022
Poster Presentation
PP 050
Improved crystal quality of the polarity selective epitaxial AlN measured by grazing incidence X-ray diffraction
Growth
10/10/2022
Poster Presentation
PP 014
X-ray diffraction used for monitoring InGaN quantum well homogenization and decomposition
Characterization, Growth
11/10/2022
Poster Presentation
PP 125
Comparison of the crystal quality of InGaN/GaN multiple quantum wells grown on sapphire and GaN substrate using X-ray diffraction
Characterization, Growth