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Abstract Talk
AT 039

Step pinning and hillock formation in (Al,Ga)N films on native AlN substrates

Appointment

Date: 11/10/2022

Time: 08:30 – 08:45

Talk time: 12 Min.

Discussion time: 3 Min.

Location / Stream:

Room Berlin

Session

Structural Characterization, Growth model-1

Topics

Characterization
Optical devices

Authors

Dr. Tobias Schulz (Leibniz-Institut für Kristallzüchtung / DE), Prof. Dr. Liverios Lymperakis (Max-Planck Institut für Eisenforschung GmbH / DE), Suhyun Yoo (Max-Planck Institut für Eisenforschung GmbH / DE), Artur Lachowski (Leibniz-Institut für Kristallzüchtung / DE), Dr. Humberto Foronda (OSRAM Opto Semiconductors GmbH / DE), Dr. Christian Brandl (OSRAM Opto Semiconductors GmbH / DE), Dr. Hans-Jürgen Lugauer (OSRAM Opto Semiconductors GmbH / DE), Professor Marc Hoffmann (OSRAM Opto Semiconductors GmbH / DE), Dr. Martin Albrecht (Leibniz-Institut für Kristallzüchtung / DE)