Session – Characterization
Structural Characterization, Growth model-1

Programme

• 08:30 – 08:45 12 Min. 3 Min.

  • Abstract Talk
  • AT 039

  Step pinning and hillock formation in (Al,Ga)N films on native AlN substrates

  • Dr. Tobias Schulz (Leibniz-Institut für Kristallzüchtung / DE)

   Characterization, Optical devices
• 08:45 – 09:00 12 Min. 3 Min.

  • Abstract Talk
  • AT 040

  Thermal conductivity characterization of (Y, Sc)AlN alloys

  • Dat Tran (Linköping University / SE)

   Characterization
• 09:00 – 09:15 12 Min. 3 Min.

  • Abstract Talk
  • AT 041

  High-resolution x-ray diffraction and 4D nanobeam diffraction analyses of cubic and hexagonal GaN films on MgF2 grown by MBE

  • Kevin Meyer (Institute of Energy Research and Physical Technologies IEPT, TU Clausthal / DE)

   Characterization, Growth
• 09:15 – 09:30 12 Min. 3 Min.

  • Abstract Talk
  • AT 042

  Identification of Burgers vectors of threading dislocations in HVPE-grown GaN using multiphoton-excitation photoluminescence

  • Dr. Tomoyuki Tanikawa (Osaka University / JP)

   Characterization, Growth
• 09:30 – 09:45 12 Min. 3 Min.

  • Abstract Talk
  • AT 043

  Microstructures of MBE-grown AlN on N-polar sputtered and annealed AlN templates

  • Prof. Dr. Yusuke Hayashi (Osaka University / JP)

   Characterization, Growth
• 09:45 – 10:00 12 Min. 3 Min.

  • Abstract Talk
  • AT 044

  Properties of oxide reconstructions in AlN and GaN

  • Kelsey J. Mirrielees (North Carolina State University / US)

   Characterization, Growth