Back
  • Poster Presentation
  • PP 325

Dependence of H-concentration on the observed reverse leakage current in p–n diodes

Appointment

Date:
Time:
Talk time:
Discussion time:
Location / Stream:
Topic Characterization

Session

Characterization

Topics

  • Characterization
  • Electronic devices

Authors

Dr. Céline Noël (imec / BE), Dr. Albert Minj (imec / BE), Dr. Thomas Hantschel (imec / BE)

    • v1.19.0
    • © Conventus Congressmanagement & Marketing GmbH
    • Imprint
    • Privacy