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Tohru Oka

Further involvements

10/10/2022
16:15 – 16:30 12 Min. 3 Min.
Abstract Talk
AT 029
Increase of reverse leakage current at GaN p-n junctions having different blocking voltages after forward current stress
Characterization, Electronic devices
12/10/2022
14:45 – 15:00 12 Min. 3 Min.
Abstract Talk
PP 034
Threshold voltage instability under positive bias stress in vertical GaN trench MOSFETs
Characterization, Electronic devices