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IWN 2022
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Meguru Endo
Nagoya University / JP
Nagoya University
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12/10/2022
17:15
–
17:30
12 Min.
3 Min.
Abstract Talk
AT 173
Si concentration dependence of nitrogen-related electron traps introduced by electron beam irradiations to homoepitaxial n-type GaN
Characterization, Electronic devices
Further involvements
12/10/2022
17:15
–
17:30
12 Min.
3 Min.
Abstract Talk
AT 173
Si concentration dependence of nitrogen-related electron traps introduced by electron beam irradiations to homoepitaxial n-type GaN
Characterization, Electronic devices
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