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IWN 2022
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Tomohiko Mori
Toyota Central R&D Labs / JP
Toyota Central R&D Labs
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Date
Further involvements
10/10/2022
16:15
–
16:30
12 Min.
3 Min.
Abstract Talk
AT 029
Increase of reverse leakage current at GaN p-n junctions having different blocking voltages after forward current stress
Characterization, Electronic devices
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