Poster zum Thema "Poster session IM 1: Progress in instrumentation and ultrafast EM"

Zurück
  • IM1.P001
Adaptive probe correction with electrostatic phase plate
  • Chu-Ping Yu (Antwerp / BE)
  • IM1.P002
Secondary electron imaging in scanning transmission electron microscopy for material science
  • IM1.P003
Low voltage transmission electron diffraction in SEM as a powerful tool for wide field of view characterization of crystalline materials
  • IM1.P004
Improving the time-resolution of event-based electron cameras using neural networks trained by femtosecond electron pulse detection
  • IM1.P005
A diffusion model for electron beam damage in STEM
  • IM1.P006
A hamiltonian mechanics framework for straight and curved charge particle optics systems
  • IM1.P007
Dealing with carbon contamination as a consequence of wet TEM sample preparation
  • IM1.P008
Study of beam sensitive and nanostructured materials by low-kV and low-dose optimized EBSD
  • IM1.P009
New Performance for SEM with an Annular Switchable Gain BSE Detector Diode
  • IM1.P010
A ground-potential monochromator design
  • IM1.P011
Optimization and new tools for 3DED data collection