Microscopy Conference 2023

A hamiltonian mechanics framework for straight and curved charge particle optics systems

IM 1: Progress in instrumentation and ultrafast EM

Poster session IM 1: Progress in instrumentation and ultrafast EM

Poster

IM 3: SEM and FIB developments

Micron-sized magnetic multipole devices for charge particle optics

This session will cover recent advancements of instrumentation for imaging and analytical purposes of transmission electron microscopy (TEM and STEM). Part of this session will focus on time-resolved electron microscopy and its various aspects to study optical excitations and nonequilibrium phenomena in materials. Contributions are welcome to describe the state of the art of instrumentation for high resolution imaging as well as all variants of analytical techniques.

Progress in instrumentation and ultrafast EM

Invited talk

IM 7: In situ/operando electron microscopy

Anderson localization of surface plasmons in two-dimensional Au-nanostructures

IM 2: Spectroscopy

Poster session IM 2: Spectroscopy

MS 4: Functional thin films

Momentum-resolved spectrum imaging for electromagnetic field mapping in plamonic nanostructures

MS 2: Metals and alloys

How to compress STEM spectrum-images into a linear combination of meaningful endmembers

IM 5: Quantitative image and diffraction data analysis

TEM data compression and denoising by autoencoders and convolutional neural networks

Poster session IM 5: Quantitative image and diffraction data analysis

LS 4: Image analysis of large data sets

Adaptation of the wsirt algorithm for vector field tomography

IM 6: Phase-related techniques & 4D STEM

Poster session IM 6: Phase-related techniques & 4D STEM

Nanoscale 3D imaging of magnetic spin textures with holographic vector-field electron tomography

This session focusses on methods associated with different aspects of phase in electron microscopy. A first topic concerns mapping of the Coulomb potential, electric or magnetic fields, for instance using methods that retrieve the phase of the electron wave such as electron holography or focus variation reconstruction. The session also covers differential phase contrast (DPC) microscopy, which is based on the acquisition of a Ronchigram per scan position (4D-STEM) with a segmented, pixelated or other dedicated detector, using the first moment of the intensity distribution or a ptychographic reconstruction of the object phase. Another topic is related to the shaping of the phase of the electron wave using different kinds of phase plates, vortex beams, and beam shaping in general. Contributions may also tackle related theoretical topics, image simulation, influence of inelastic contributions and similar aspects.

Axel Lubk

Vortrag

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