Poster zum Thema "Poster session IM 6: Phase-related techniques & 4D STEM"

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  • IM6.P001
Can a difference in mean inner potential be measured from a shift of the central disc in nano-beam electron diffraction?
  • Christoph Mahr (Bremen / DE)
  • IM6.P002
GaN atomic electric fields from STEM: Panther vs. EMPAD
  • IM6.P003
Towards quantitative electric field measurements at hetero interfaces via precessing 4D-STEM
  • IM6.P004
Phase retrieval of WS2 with rPIE
  • IM6.P005
Impact of dynamical scattering on first moment imaging of a ferroelectric PbZr0.2Ti0.8O3
  • IM6.P006
Towards quantitative measurements of electric fields in TEM: a synergy of electrical biasing STEBIC and off-axis electron holography
  • IM6.P007
Shape sensitivity in momentum resolved STEM
  • IM6.P008
Electron ptychographic phase imaging of beam-sensitive all-inorganic halide perovskites using 4D-STEM
  • IM6.P009
Simultaneous mapping of magnetic and atomic structure of ferromagnetic metallic glass using Ltz-4D-STEM
  • IM6.P010
In-situ electric fields mapping of potential-induced processes by pixelated-DPC
  • IM6.P011
Reciprocity based phase contrast in a conventional TEM setup
  • IM6.P012
Optimum BF (OBF) STEM using the SAAF detector
  • IM6.P013
Integrated differential phase contrast (iDPC) STEM for ultimate low dose imaging at atomic resolution, including cryo nano particles
  • IM6.P014
Towards quantification of electric fields at interfaces in battery materials
  • IM6.P015
Correlative microstructural, compositional and magnetic characterization of phase-separated high entropy alloys
  • IM6.P016
Fast pixelated direct detector with center hole to enable simultaneous 4D-STEM and EELS
  • IM6.P017
Application of phase-shifting off-axis holography to the reconstruction of atomic-resolution exit waves
  • IM6.P018
DPC-Toolbox, a software for post-processing and analysis of differential phase contrast STEM images
  • IM6.P019
Influence of plasmon-excitation electrons on ptychography phase imaging
  • IM6.P020
Wirtinger Flow: the effect of different noise models for low-dose scanning electron transmission microscopy
  • IM6.P021
Large-scale 3D phase-contrast imaging from scanning diffraction measurements
  • IM6.P023
Playground 4D-STEM in SEMs: a rich toolbox for a wide range of applications
  • IM6.P024
Breaking the resolution limit of electron microscopy of magnetic materials using 4D-STEM ptychography
  • IM6.P025
Mapping nanoscale strain fields in metallic glass composites via precession nanobeam electron diffraction
  • IM6.P026
Fast ptychographic reconstruction for low dose, binary 4D STEM
  • IM6.P027
Disentangling the contributions to the 4D-STEM signal at interfaces by muti-slice simulations
  • IM6.P028
Magnetic phase imaging using Lorentz near-field electron ptychography
  • IM6.P029
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D STEM
  • IM6.P030
Adaptation of the wsirt algorithm for vector field tomography
  • IM6.P031
First experimental results with the latest generation hybrid-pixel detector from DECTRIS for 4D STEM