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Janghyun Jo

Jülich / DE

Research Centre Juelich

Vortrag

01.03.2023
Poster
IM6.P029
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D STEM
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM

Weitere Beteiligungen

28.02.2023
Poster
IM5.P0018
Quantitative field mapping around electrically biased needles by STEM & holography
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
01.03.2023
Poster
IMLB.P018
Event-driven MHz 4D STEM for low dose and in situ electron microscopy
IM 1: Progress in instrumentation and ultrafast EM, IMLB: Late breaking abstracts
01.03.2023
Poster
IM6.P029
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D STEM
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM