Microscopy Conference 2023

Novel nanostructures and materials enabled by graphene embedding and sandwiching

MS 3: Low-dimensional and quantum materials

Poster session MS 3: Low-dimensional and quantum materials

Poster

IM 1: Progress in instrumentation and ultrafast EM

Aligned stacking of nanopatterned 2D materials for high-resolution 3D device fabrication

IM 3: SEM and FIB developments

First experimental results with the latest generation hybrid-pixel detector from DECTRIS for 4D STEM

IM 6: Phase-related techniques & 4D STEM

Poster session IM 6: Phase-related techniques & 4D STEM

Detecting charge transfer in defective 2D WS2 with electron ptychography

IMLB: Late breaking abstracts

Late breaking posters IM

Analyzing and assembling layered materials, atom by atom and layer by layer, in 2D and 3D

This session focuses on the development and application of advanced imaging, diffraction and spectroscopy to provide new insight into the structural, compositional and functional properties of low-dimensional and quantum materials. A specific focus will be placed on methods for imaging individual defects, enhancing the contrast of light atoms, preparing and cleaning ultra-thin samples, developing automated workflows for low dose imaging of beam sensitive materials and linking electron microscopy with complementary characterisation techniques. Other topics of interest include in situ experiments carried out at cryogenic or elevated temperature, as well as in the presence of external stimuli such as applied voltage, field, gases or light.

Christoph Hofer

Vortrag

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