Microscopy Conference 2023

Including inelastic plasmon scattering in multislice simulations for STEM: a real space integration scheme

IM 5: Quantitative image and diffraction data analysis

Poster session IM 5: Quantitative image and diffraction data analysis

Poster

Towards quantitative electric field measurements at hetero interfaces via precessing 4D-STEM

IM 6: Phase-related techniques & 4D STEM

Poster session IM 6: Phase-related techniques & 4D STEM

4D-STEM on epitaxially grown vertical heterostructures of WS2 on Graphene

MS 3: Low-dimensional and quantum materials

Poster session MS 3: Low-dimensional and quantum materials

Phase retrieval of WS2 with rPIE

TEM characterization of amorphous molecular clusters for directional white-light generation

IM 2: Spectroscopy

Establishing in-situ heating experiments of monolithic LiNiO2 particles in O2 atmosphere

MS 1: Energy-related materials and catalysts

The session is focused on generating insights into the function of materials for energy storage, energy conversion and catalysis. Topics can be – but are not restricted to - charge transport, dynamics at interfaces (electrolyte/electrode or gas-phase/catalyst surface), cycling behavior and aging/deactivation. We are very interested in contributions that attempt to capture the relevant functional state of energy materials and catalysts, i.e., studies that reach beyond imaging of isolated systems in vacuum or investigations that employ an embedded multi-scale (in space and time) approach that allows to link between atomistic and collective dynamics. We also call for contributions regarding efficient detection of various generated signals, correlative application of analytical methods, as well as utilizing and developing quantitative data-analysis and machine learning. Studies on the impact of the electron beam for (in-situ) investigation of materials for energy-related or catalysis applications are also highly welcome.

Energy-related materials and catalysts I

Abstract talk

IM 7: In situ/operando electron microscopy

Quantitative electric field determination in semiconductor homo- and hetero-interfaces using electron diffraction and 4D-STEM

This session focusses on methods associated with different aspects of phase in electron microscopy. A first topic concerns mapping of the Coulomb potential, electric or magnetic fields, for instance using methods that retrieve the phase of the electron wave such as electron holography or focus variation reconstruction. The session also covers differential phase contrast (DPC) microscopy, which is based on the acquisition of a Ronchigram per scan position (4D-STEM) with a segmented, pixelated or other dedicated detector, using the first moment of the intensity distribution or a ptychographic reconstruction of the object phase. Another topic is related to the shaping of the phase of the electron wave using different kinds of phase plates, vortex beams, and beam shaping in general. Contributions may also tackle related theoretical topics, image simulation, influence of inelastic contributions and similar aspects.

Phase-related techniques & 4D STEM

Reciprocity based phase contrast in a conventional TEM setup

This symposium is hosted by the DGE Young Microscopists working group (yDGE) and will cover topics especially interesting for young researchers. For this, we invited experts who will give insights on publication writing and career planning.
In addition, we want to offer students the opportunity to give a short talk on their work in front of their young colleagues, to gain presentation experience in a casual atmosphere and enhance the scientific exchange.
The newly founded working group DGE Young Microscopists will briefly introduce their activities and possibilities to join.
Our goal is a lively, relaxed exchange between students and early-career postdocs to connect to like-minded colleagues. For this, the symposium will be followed by a social event nearby the conference's venue.


DGE young microscopists symposium

MS 5: Functional organic materials

Towards quantification of electric fields at interfaces in battery materials

Disentangling the contributions to the 4D-STEM signal at interfaces by muti-slice simulations

Kerstin Volz

Vorsitz

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