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Investigation of time-dependent breakdown mechanisms in normally-off GaN HEMTs with Schottky p-GaN gate

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Topic Electronic devices

Session

Electronic devices

Themen

  • Electronic devices
  • Novel Materials and Nanostructures

Mitwirkende

Myeongsu Chae (Hongik University / KR), Jihwan Ahn (Hongik University / KR), Van Cuong Nguyen (Hongik University / KR), Professor Hyungtak Kim (Hongik University / KR)

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