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Quantitative dislocation analysis of GaN in the scanning electron microscope

Termin

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Topic Characterization

Session

Characterization

Themen

  • Characterization
  • Optical devices

Mitwirkende

Kieran Hiller (University of Strathclyde / GB), Dr. Jochen Bruckbauer (University of Strathclyde / GB), Dr. Aimo Winkelmann (AGH University of Science and Technology / PL), Dr. Ben Hourahine (University of Strathclyde / GB), Prof. Dr. Robert Martin (University of Strathclyde / GB), Peng Feng (University of Sheffield / GB), Professor Tao Wang (University of Sheffield / GB)

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