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Dr. Ben Hourahine

Weitere Beteiligungen

10.10.2022
13:45 – 14:00 12 Min. 3 Min.
Abstract Talk
AT 004
Correlative light-electron microscopy – non-destructive imaging of residual strains and their effect on optical and electrical properties of III-Nitrides
Characterization, Growth
11.10.2022
Poster Presentation
PP 214
Observation of novel orientations in an AlN thin film grown on m-plane sapphire using electron backscatter diffraction
Characterization, Growth
12.10.2022
Poster Presentation
PP 314
Quantitative dislocation analysis of GaN in the scanning electron microscope
Characterization, Optical devices