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  • Poster Presentation
  • PP 017

Dark spots around threading dislocations in GaN and AlGaN layers – size variations and impact on internal quantum efficiency

Termin

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Topic Characterization

Session

Characterization

Themen

  • Characterization
  • Optical devices

Mitwirkende

Dr. Carsten Netzel (Ferdinand-Braun Institute / DE), Dr. Arne Knauer (Ferdinand-Braun Institute / DE), Dr. Frank Brunner (Ferdinand-Braun Institute / DE), Dr. Johannes Enslin (Ferdinand-Braun Institute / DE), Dr. Anna Mogilatenko (Ferdinand-Braun Institute / DE), Dr. Marcel Schilling (Technical University Berlin / DE), Prof. Dr. Michael Kneissl (Technical University Berlin / DE), Prof. Dr. Markus Weyers (Ferdinand-Braun Institute / DE)

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