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Poster Presentation
PP 264

High-resolution x-ray diffraction analysis of cubic GaN films on MgO (1 1 0) grown under different growth conditions by MBE

Termin

Datum: 11.10.2022

Zeit: 13:15 – 13:15

Redezeit: 0 Min.

Diskussionszeit: 0 Min.

Ort / Stream:

Session

Themen

Characterization
Growth

Mitwirkende

Kevin Meyer (Institute of Energy Research and Physical Technologies IEPT, TU Clausthal / DE), Martin Buchholz (Institute of Energy Research and Physical Technologies IEPT, TU Clausthal / DE), Prof. Dr. Daniel Schaadt (Institute of Energy Research and Physical Technologies IEPT, TU Clausthal / DE)