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Dr. Byeongchan So

Karlsruhe Institute of Technology (KIT) / DE

Karlsruhe Institute of Technology (KIT)

Einsätze

10.10.2022

Poster Presentation
PP 050
Improved crystal quality of the polarity selective epitaxial AlN measured by grazing incidence X-ray diffraction
Growth

11.10.2022

Poster Presentation
PP 125
Comparison of the crystal quality of InGaN/GaN multiple quantum wells grown on sapphire and GaN substrate using X-ray diffraction
Characterization, Growth