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MC 2023
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Poster presentations
PS 10
Poster session IM 3: SEM and FIB developments
Appointment
Date:
28/02/2023
Time:
14:00
–
16:00
Location / Stream:
poster session 3
Session chairs
Andreas Graff
Halle (Saale) / DE
Irina Harder
Erlangen / DE
Programme
Poster
IM3.P001
Characterisation of a timepix detector for use in SEM acceleration voltage range
Nikita Denisov (Antwerp / BE)
IM 3: SEM and FIB developments, IM 6: Phase-related techniques & 4D STEM
Poster
IM3.P002
A novel ion source for Lithium-ion microscopy and 3D tomography
Jörg Stodolka (Dortmund / DE)
IM 3: SEM and FIB developments
Poster
IM3.P003
Multi-voltage FIB-tomography of the hierarchical nanoporous gold
Alexander Shkurmanov (Hamburg / DE)
IM 3: SEM and FIB developments, MS 2: Metals and alloys
Poster
IM3.P004
Implementation of elastic and inelastic scattering processes for electrons with energies below 30 keV in Geant4 for the simulation of SEM
Martin Hermann (Braunschweig / DE)
IM 3: SEM and FIB developments, IM 5: Quantitative image and diffraction data analysis
Poster
IM3.P005
Video frame interpolation neural network for FIB-SEM tomography
Laura Gambini (Dublin / IE)
IM 3: SEM and FIB developments, LS 3: Imaging of large volumes and plastic section tomography
Poster
IM3.P006
Traceable size measurement of polysterene particles with sizes up to 500 nm using STEM-in-SEM together with simulation-based image analysis
Tobias Klein (Braunschweig / DE)
IM 3: SEM and FIB developments, MS 3: Low-dimensional and quantum materials
Poster
IM3.P007
JEOL`s JSM-IT800 series: high performance SEM for all users
Tristan Harzer (Freising / DE)
IM 3: SEM and FIB developments
Poster
IM3.P008
Advanced focused ion beam milling techniques for TEM specimen preparation of solid bulk samples
Lidia Kibkalo (Jülich / DE)
IM 3: SEM and FIB developments
Poster
IM3.P009
TEM sample preparation with high-energy Xenon ions and focused low-energy Argon by plasma FIB
Daniel Phifer (Eindhoven / NL)
IM 3: SEM and FIB developments, LS 7: Advances in sample preparation
Poster
IM3.P010
Using machine learning and topographic SEM imaging for software assisted fractography
Matthias Hemmleb (Halle (Saale) / DE)
IM 3: SEM and FIB developments, MS 2: Metals and alloys
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