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MC 2023
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DE
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Tobias Klein
Braunschweig / DE
Physikalisch-Technische Bundesanstalt (PTB)
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28/02/2023
Poster
IM3.P006
Traceable size measurement of polysterene particles with sizes up to 500 nm using STEM-in-SEM together with simulation-based image analysis
IM 3: SEM and FIB developments, MS 3: Low-dimensional and quantum materials
Further involvements
28/02/2023
Poster
IM5.P003
Analysing gold nanorod STEM-in-SEM signals at 20 and 30 keV beam energies using a simulation combining explicite diffraction calculations with Monte Carlo strategies
IM 3: SEM and FIB developments, IM 5: Quantitative image and diffraction data analysis
28/02/2023
Poster
IM3.P004
Implementation of elastic and inelastic scattering processes for electrons with energies below 30 keV in Geant4 for the simulation of SEM
IM 3: SEM and FIB developments, IM 5: Quantitative image and diffraction data analysis
28/02/2023
Poster
IM3.P006
Traceable size measurement of polysterene particles with sizes up to 500 nm using STEM-in-SEM together with simulation-based image analysis
IM 3: SEM and FIB developments, MS 3: Low-dimensional and quantum materials
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