PS 22
Poster session IM 6: Phase-related techniques & 4D STEM

Programme

• • Poster
  • IM6.P001

  Can a difference in mean inner potential be measured from a shift of the central disc in nano-beam electron diffraction?

  • Christoph Mahr (Bremen / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P002

  GaN atomic electric fields from STEM: Panther vs. EMPAD

  • Tim Grieb (Bremen / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P003

  Towards quantitative electric field measurements at hetero interfaces via precessing 4D-STEM

  • Jonas Scheunert (Marburg / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P004

  Phase retrieval of WS₂ with rPIE

  • Johannes Haust (Marburg / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P005

  Impact of dynamical scattering on first moment imaging of a ferroelectric PbZr_0.2Ti_0.8O₃

  • Achim Strauch (Jülich / DE)

   IM 6: Phase-related techniques & 4D STEM, MS 7: Ceramics and composites
• • Poster
  • IM6.P006

  Towards quantitative measurements of electric fields in TEM: a synergy of electrical biasing STEBIC and off-axis electron holography

  • Frederik Otto (Berlin / DE)
  • Tolga Wagner (Berlin / DE)

   IM 6: Phase-related techniques & 4D STEM, IM 7: In situ/operando electron microscopy
• • Poster
  • IM6.P007

  Shape sensitivity in momentum resolved STEM

  • Hoel Laurent Robert (Jülich / DE)

   IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P008

  Electron ptychographic phase imaging of beam-sensitive all-inorganic halide perovskites using 4D-STEM

  • Anna Scheid (Stuttgart / DE)

   IM 6: Phase-related techniques & 4D STEM, MS 1: Energy-related materials and catalysts
• • Poster
  • IM6.P009

  Simultaneous mapping of magnetic and atomic structure of ferromagnetic metallic glass using Ltz-4D-STEM

  • Sangjun Kang (Eggenstein-Leopoldshafen / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P010

  In-situ electric fields mapping of potential-induced processes by pixelated-DPC

  • Pierpaolo Ranieri (Lausanne / CH)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P011

  Reciprocity based phase contrast in a conventional TEM setup

  • Tizian Lorenzen (Munich / DE)

   IM 6: Phase-related techniques & 4D STEM, MS 5: Functional organic materials
• • Poster
  • IM6.P012

  Optimum BF (OBF) STEM using the SAAF detector

  • Philipp Wachsmuth (Freising / DE)

   IM 6: Phase-related techniques & 4D STEM, LS 4: Image analysis of large data sets
• • Poster
  • IM6.P013

  Integrated differential phase contrast (iDPC) STEM for ultimate low dose imaging at atomic resolution, including cryo nano particles

  • Ivan Lazić (Eindhoven / NL)

   IM 4: Development of cryo-EM instrumentation and techniques, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P014

  Towards quantification of electric fields at interfaces in battery materials

  • Shamail Ahmed (Marburg / DE)

   IM 6: Phase-related techniques & 4D STEM, MS 1: Energy-related materials and catalysts
• • Poster
  • IM6.P015

  Correlative microstructural, compositional and magnetic characterization of phase-separated high entropy alloys

  • András Kovács (Jülich / DE)

   IM 6: Phase-related techniques & 4D STEM, MS 2: Metals and alloys
• • Poster
  • IM6.P016

  Fast pixelated direct detector with center hole to enable simultaneous 4D-STEM and EELS

  • Martin Huth (Munich / DE)

   IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P017

  Application of phase-shifting off-axis holography to the reconstruction of atomic-resolution exit waves

  • Ulrich Ross (Göttingen / DE)

   IM 6: Phase-related techniques & 4D STEM, IM 7: In situ/operando electron microscopy
• • Poster
  • IM6.P018

  DPC-Toolbox, a software for post-processing and analysis of differential phase contrast STEM images

  • Julius Bürger (Paderborn / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P019

  Influence of plasmon-excitation electrons on ptychography phase imaging

  • Zhiyuan Ding (Oxford / GB)

   IM 2: Spectroscopy, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P020

  Wirtinger Flow: the effect of different noise models for low-dose scanning electron transmission microscopy

  • Max Leo Leidl (Jülich / DE)

   IM 6: Phase-related techniques & 4D STEM, LS 1: High-resolution cryo-EM
• • Poster
  • IM6.P021

  Large-scale 3D phase-contrast imaging from scanning diffraction measurements

  • Philipp Pelz (Nuremberg / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P023

  Playground 4D-STEM in SEMs: a rich toolbox for a wide range of applications

  • Johannes Müller (Berlin / DE)

   IM 3: SEM and FIB developments, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P024

  Breaking the resolution limit of electron microscopy of magnetic materials using 4D-STEM ptychography

  • Maximilian Töllner (Karlsruhe / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P025

  Mapping nanoscale strain fields in metallic glass composites via precession nanobeam electron diffraction

  • Lukas Schretter (Leoben / AT)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P026

  Fast ptychographic reconstruction for low dose, binary 4D STEM

  • Emma Hedley (Oxford / GB)

   IM 1: Progress in instrumentation and ultrafast EM, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P027

  Disentangling the contributions to the 4D-STEM signal at interfaces by muti-slice simulations

  • Andreas Beyer (Marburg / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P028

  Magnetic phase imaging using Lorentz near-field electron ptychography

  • Shengbo You (Sheffield / GB)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P029

  Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D STEM

  • Janghyun Jo (Jülich / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P030

  Adaptation of the wsirt algorithm for vector field tomography

  • Sebastian Sturm (Munich / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM6.P031

  First experimental results with the latest generation hybrid-pixel detector from DECTRIS for 4D STEM

  • Emiliya Poghosyan (Villigen / CH)

   IM 6: Phase-related techniques & 4D STEM