Microscopy Conference 2023

Electrical fields in AlN/GaN-nanowires measured with aberration-corrected 4D-STEM

IM 6: Phase-related techniques & 4D STEM

This session focusses on methods associated with different aspects of phase in electron microscopy. A first topic concerns mapping of the Coulomb potential, electric or magnetic fields, for instance using methods that retrieve the phase of the electron wave such as electron holography or focus variation reconstruction. The session also covers differential phase contrast (DPC) microscopy, which is based on the acquisition of a Ronchigram per scan position (4D-STEM) with a segmented, pixelated or other dedicated detector, using the first moment of the intensity distribution or a ptychographic reconstruction of the object phase. Another topic is related to the shaping of the phase of the electron wave using different kinds of phase plates, vortex beams, and beam shaping in general. Contributions may also tackle related theoretical topics, image simulation, influence of inelastic contributions and similar aspects.

Phase-related techniques & 4D STEM

Abstract talk

IM 5: Quantitative image and diffraction data analysis

Can a difference in mean inner potential be measured from a shift of the central disc in nano-beam electron diffraction?

Poster session IM 6: Phase-related techniques & 4D STEM

Poster

GaN atomic electric fields from STEM: Panther vs. EMPAD

Including inelastic plasmon scattering in multislice simulations for STEM: a real space integration scheme

Poster session IM 5: Quantitative image and diffraction data analysis

Composition and strain of pseudomorphic α-(AlGa)2O3 on sapphire (0001) substrates

Tim Grieb

Speaker

Further involvements