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MC 2023
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DE
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Kristina Weinel
Berlin / DE
Bundesanstalt für Materialforschung und -prüfung
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01/03/2023
Poster
IM7.P030
Damage induced by electric field (DIEF) of gold microparticles on silicon oxide substrate in the scanning electron microscope (SEM)
IM 7: In situ/operando electron microscopy, MS 3: Low-dimensional and quantum materials
Further involvements
01/03/2023
Poster
IM7.P030
Damage induced by electric field (DIEF) of gold microparticles on silicon oxide substrate in the scanning electron microscope (SEM)
IM 7: In situ/operando electron microscopy, MS 3: Low-dimensional and quantum materials
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