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Kristina Weinel

Berlin / DE

Bundesanstalt für Materialforschung und -prüfung

Engagements

01/03/2023

Poster
IM7.P030
Damage induced by electric field (DIEF) of gold microparticles on silicon oxide substrate in the scanning electron microscope (SEM)
IM 7: In situ/operando electron microscopy, MS 3: Low-dimensional and quantum materials