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Poster Presentation
PP 035

Evaluation of hole trap density at SiO₂/GaN MOS interfaces through capacitance-voltage measurements under ultraviolet light illumination

Appointment

Date: 10/10/2022

Time: 17:30 – 17:30

Talk time: 0 Min.

Discussion time: 0 Min.

Location / Stream:

Topic Electronic devices

Session

Electronic devices

Topics

Characterization
Electronic devices

Authors

Takuma Kobayashi (Osaka University / JP), Kazuki Tomigahara (Osaka University / JP), Hidetoshi Mizobata (Osaka University / JP), Mikito Nozaki (Osaka University / JP), Takayoshi Shimura (Osaka University / JP), Heiji Watanabe (Osaka University / JP)