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Abstract Talk
AT 026

Nanoscale dopant profiling of individual semiconductor wires by capacitance-voltage measurements

Appointment

Date: 10/10/2022

Time: 16:30 – 16:45

Talk time: 12 Min.

Discussion time: 3 Min.

Location / Stream:

Session

Topics

Characterization
Novel Materials and Nanostructures

Authors

Dr. Timothée Lassiaz (Aledia / FR), Dr. Pierre Tchoulfian (Aledia / FR), Dr. Gwénolé Jacopin (CNRS, Institut Néel / FR), Dr. Fabrice Donatini (CNRS, Institut Néel / FR), Prof. Dr. Julien Pernot (CNRS, Institut Néel / FR)