Back
  • Abstract Talk
  • AT 016

Growth and characterization of high Al-mole-fraction AlGaN on patterned GaN platforms for mitigating strain-induced cracks beyond the critical layer thickness

Appointment

Date:
Time:
Talk time:
Discussion time:
Location / Stream:
Salon Moskau

Session

AlGaN Relaxation and Applications

Topics

  • Growth
  • Optical devices

Authors

Professor Russell Dupuis (Georgia Institute of Technology / US), Dr. Theeradetch Detchprohm (Georgia Institute of Technology / US)

  • © Conventus Congressmanagement & Marketing GmbH