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  • Abstract Talk
  • AT 247

Kelvin Probe Force Microscopy under transient variable illumination – a novel characterization technique to unveil charge carrier transfer dynamics in GaN-based materials

Appointment

Date:
Time:
Talk time:
Discussion time:
Location / Stream:
Room Berlin

Session

Late News Characterization

Topics

  • Characterization
  • Optical devices

Authors

Dr. Palmerina González-Izquierdo (CEA / FR), Davide Zoccarato (CEA / FR), Névine Rochat (CEA / FR), Julia Simon (CEA / FR), Patrick Le Maitre (CEA / FR), Marion Volpert (CEA / FR), Dr. Matthew Charles (CEA / FR), Dr. Łukasz Borowik (CEA / FR)

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